HIGH-RESOLUTION DIFFRACTION-SPACE MAPPING AND TOPOGRAPHY

The importance of collecting the distribution of scattered X-rays in t wo dimensions with the ''right probe'' will be addressed. The data-col lection method will be briefly covered and how this greatly assists th e interpretation of structural features giving rise to the distributed X-ray scattering. The combination of diffraction-space mapping with m ultiple crystal topography will also be presented to show how any regi on of scattering can be related to lateral structural changes or cryst al imperfections. The simulation of the diffraction profiles of struct ures with defects will be addressed as well as the interpretation of ' 'unusual and strange'' diffraction features observed in high resolutio n, which yield further useful information on the materials under study .