MOLECULAR-DYNAMICS STUDY OF SURFACE SEGREGATION IN LIQUID SEMICONDUCTOR ALLOYS

Authors
Citation
Wb. Yu et D. Stroud, MOLECULAR-DYNAMICS STUDY OF SURFACE SEGREGATION IN LIQUID SEMICONDUCTOR ALLOYS, Physical review. B, Condensed matter, 56(19), 1997, pp. 12243-12249
Citations number
34
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
56
Issue
19
Year of publication
1997
Pages
12243 - 12249
Database
ISI
SICI code
0163-1829(1997)56:19<12243:MSOSSI>2.0.ZU;2-W
Abstract
We report the results of a molecular-dynamics study of the surface ten sion and surface profile of liquid Si and Ge (l-Si and l-Ge) and their alloys using empirical Stillinger-Weber potentials. The calculations are carried out at two temperatures slightly above the melting tempera tures of Si and Ge and the alloys Si0.8Ge0.2 and Si0.2Ge0.8. They show clear evidence of surface segregation by Ge, the component with the l ower surface tension.