K. Osvay et al., DIRECT WRITING AND IN-SITU MATERIAL PROCESSING BY A LASER-MICROMACHINING PROJECTION MICROSCOPE, Applied physics. A, Solids and surfaces, 58(3), 1994, pp. 211-214
The new laser micromachining projection microscope enables a surface t
o be viewed at high magnification with a built-in facility for microma
chining of the same surface according to a predetermined pattern. A Xe
Cl-excimer laser forms part of the device and provides bright viewing
illumination in amplified spontaneous emission as well as a small lase
r spot of sufficient fluence to mark the sample surface. The basic cha
racteristics of image enhancement in the excimer amplifier are present
ed. The advantage of such a technique for both pattern generation, sur
face cleaning and mask correction is demonstrated on Al, Cu and W spec
imens with a spatial resolution better than 3 mum.