X-RAY 2-CRYSTAL DIFFRACTION WITH SIMULTANEOUS REGISTRATION OF ROCKINGCURVES OF AGK-ALPHA AND NIK-ALPHA RADIATION

A two-crystal method with simultaneous registration of polychromatic r ocking curves is tested. The method is useful to detect subsurface def ects in monocrystals depending on the depth. For example, it is possib le to separate the influences of near-surface defects and volume defec ts (small angle grain boundaries or internal stresses) by the differen t penetration depths of the used AgK(alpha) and NiK(alpha) radiation. These two wavelengths were generated in a special X-ray tube with a tw o-element anode.