CHARACTERIZATION OF TE ZN/TE ... MULTILAYERS DEPOSITED BY RF-SPUTTERING/

Authors
BELLAKHDER H DEBBAGH F OUTZOURHIT A BENNOUNA A BRUNEL M AMEZIANE EL
Citation
H. Bellakhder et al., CHARACTERIZATION OF TE ZN/TE ... MULTILAYERS DEPOSITED BY RF-SPUTTERING/, Solar energy materials and solar cells, 45(4), 1997, pp. 361-368
Citations number
15
Categorie Soggetti
Energy & Fuels","Material Science
Journal title
Solar energy materials and solar cells → ACNP
ISSN journal
09270248
Volume
45
Issue
4
Year of publication
1997
Pages
361 - 368
Database
ISI
SICI code
0927-0248(1997)45:4<361:COTZ.M>2.0.ZU;2-G
Abstract
Structures consisting of alternating Te and Zn layers were prepared by RF-sputtering. Grazing incidence X-ray diffraction (GIXD) measurement s revealed the formation of ZnTe and the existence of free Zn in as-de posited samples. Similar measurements on samples annealed for 2 h at 3 00 degrees C showed enhanced crystallinity of ZnTe as well as the form ation of oxides when annealing time is extended to 8 h. UV-Visible-NIR transmission measurements showed that metallic-type absorption domina tes in as-deposited samples. Annealed samples at 300 degrees C showed well defined absorption edges with an energy gap of 2.50 eV for anneal ing times of 2 h and 2.24 eV when the annealing time is extended to 8 h.