FRICTION FORCE MICROSCOPY ON WELL-DEFINED SURFACES

Citation
E. Meyer et al., FRICTION FORCE MICROSCOPY ON WELL-DEFINED SURFACES, Nanotechnology, 7(4), 1996, pp. 340-344
Citations number
31
Categorie Soggetti
Engineering,"Physics, Applied
Journal title
ISSN journal
09574484
Volume
7
Issue
4
Year of publication
1996
Pages
340 - 344
Database
ISI
SICI code
0957-4484(1996)7:4<340:FFMOWS>2.0.ZU;2-T
Abstract
Friction force microscopy is implemented in ultrahigh vacuum condition s, Atomic-scale friction is observed on clean surfaces. The onset of a tomic-scale stick-slip is observed and discussed in relation to the pl ucking model. Comparative measurements of AgBr(001) versus NaCl(001) a nd C-60 versus NaCl(001) demonstrate the material-specific contrast of friction. Contrast mechanisms are discussed in relation to these expe riments. The role of the chemical nature of the tip is exemplified for the case of Si(111) 7 x 7, where wearless sliding is achieved with a PTFE-coated probing tip.