ULTRAFAST VOLTAGE-CONTRAST SCANNING PROBE MICROSCOPY

Citation
F. Ho et al., ULTRAFAST VOLTAGE-CONTRAST SCANNING PROBE MICROSCOPY, Nanotechnology, 7(4), 1996, pp. 385-389
Citations number
10
Categorie Soggetti
Engineering,"Physics, Applied
Journal title
ISSN journal
09574484
Volume
7
Issue
4
Year of publication
1996
Pages
385 - 389
Database
ISI
SICI code
0957-4484(1996)7:4<385:UVSPM>2.0.ZU;2-R
Abstract
Although scanning probe microscopy is traditionally limited to slow te mporal response, techniques utilizing nonlinear tip-to-sample interact ions can be used to capture very fast temporal signals (voltages, in o ur case). Such SPM-based techniques may deliver unrivaled spatial and temporal resolution. We have developed a scanning force microscope pro be for measuring ultrafast voltage signals with picosecond time resolu tion. Measurements of VLSI and MMIC devices are shown.