AN INTRODUCTION TO ION OPTICS FOR THE MASS SPECTROGRAPH

Citation
Tw. Burgoyne et Gm. Hieftje, AN INTRODUCTION TO ION OPTICS FOR THE MASS SPECTROGRAPH, Mass spectrometry reviews, 15(4), 1996, pp. 241-259
Citations number
137
Categorie Soggetti
Spectroscopy
Journal title
ISSN journal
02777037
Volume
15
Issue
4
Year of publication
1996
Pages
241 - 259
Database
ISI
SICI code
0277-7037(1996)15:4<241:AITIOF>2.0.ZU;2-T
Abstract
A mass spectrograph is an instrument that separates and simultaneously focuses ions, along a focal plane, of different mass/charge ratios th at are diverging in direction and that have a variable velocity. With these instruments and a spatially sensitive ion detector, simultaneous detection can be employed, which has been shown to improve precision and throughput (as compared to a mass spectrometer that can only detec t one mass at a time). Knowing how an ion beam focuses throughout the mass spectrograph and onto the focal plane is crucial. We present here rudimentary ion optics of the mass spectrograph in a simple yet useab le manner. From there; we investigate the direction and energy focal l ines of some mass spectrograph geometries, using the ion optics presen ted. Lastly, other mass spectrograph geometries that fall outside the field of knowledge of the ion optics covered are discussed. With this review, we hope to provide an understandable and universal ion optic t heory that encompasses a wide range of mass spectrographs and that is palatable to the novice as well as the expert. (C) 1997 John Wiley & S ons, Inc.