Corrosion and filming behaviour of aluminium have been investigated by
atomic force microscopy (AFM). Preliminary examination of the alumini
um surfaces prepared by conventional surface pre-treatment procedures,
e.g. electropolishing, mechanical polishing, etc., has shown that mic
roscopically smooth aluminium surfaces suitable for AFM study cannot b
e obtained readily by existing procedures. Thus, a new and novel techn
ique has been developed for the preparation of clean and microscopical
ly smooth aluminium surfaces for AFM study. The technique is based on
cutting small strips of aluminium specimens, encapsulated in an epoxy
resin, by a diamond knife using an ultramicrotome. With this technique
, clean aluminium surfaces, which are microscopically smooth to within
1 nm over a scanned area of 1 mu m x 1 mu m or, perhaps, even greater
, are readily prepared. Aluminium specimens with such microscopically
smooth surfaces were given various treatments and examined by AFM. It
was found that AFM, despite its unprecedented high resolution, does no
t allow one to one correspondence to be made between local film charac
ter and microscopic inhomogeneities of the aluminium surfaces associat
ed with fine features such as grain boundaries or cellular boundaries
which are known to play a crucial role in the development of chromate
chemical conversion coatings or nucleation of pits. Fortunately, howev
er, microscopical information can be obtained by transmission electron
microscopy of ultramicrotomed sections. Thus, the potential of AFM is
realized fully if it is combined with transmission electron microscop
y of ultramicrotomed sections. Otherwise and for aluminium in particul
ar, AFM is merely an approach to image surfaces in situ or ex situ at
resolutions considerably higher than those attained by high resolution
scanning electron microscopy. (C) 1997 Elsevier Science Ltd.