MECHANISMS OF PHOTOBLEACHING OF 5 EV OPTICAL-ABSORPTION BAND IN HYDROGEN LOADED GE-DOPED SIO2

Citation
K. Awazu et al., MECHANISMS OF PHOTOBLEACHING OF 5 EV OPTICAL-ABSORPTION BAND IN HYDROGEN LOADED GE-DOPED SIO2, Journal of non-crystalline solids, 211(1-2), 1997, pp. 158-163
Citations number
21
Categorie Soggetti
Material Science, Ceramics
ISSN journal
00223093
Volume
211
Issue
1-2
Year of publication
1997
Pages
158 - 163
Database
ISI
SICI code
0022-3093(1997)211:1-2<158:MOPO5E>2.0.ZU;2-K
Abstract
Photo-induced effects in H-2 loaded 1GeO(2):9SiO(2) glass were studied . The intensity of the absorption band at 5.14 eV was reduced with UV illumination. The neutral oxygen vacancy and also the Gr lone pair cen ters are reduced with the illumination. There is a one-by-one correlat ion between the reduction of Ge lone pair centers and the generation o f Ge-E' center. We propose that a Ge lone pair center reacts with H-2 molecules in glass to generate a Ce-E' center.