THERMAL-CONDUCTIVITY OF THIN METALLIC-FILMS MEASURED BY PHOTOTHERMAL PROFILE ANALYSIS

Authors
LANGER G HARTMANN J REICHLING M
Citation
G. Langer et al., THERMAL-CONDUCTIVITY OF THIN METALLIC-FILMS MEASURED BY PHOTOTHERMAL PROFILE ANALYSIS, Review of scientific instruments, 68(3), 1997, pp. 1510-1513
Citations number
20
Categorie Soggetti
Physics, Applied","Instument & Instrumentation
Journal title
Review of scientific instruments → ACNP
ISSN journal
00346748
Volume
68
Issue
3
Year of publication
1997
Pages
1510 - 1513
Database
ISI
SICI code
0034-6748(1997)68:3<1510:TOTMMB>2.0.ZU;2-I
Abstract
Thermal conductivity of nickel and gold films on quartz (thickness 0.4 -8 mu m) was measured by a modulated thermoreflectance technique recor ding the surface temperature profile. Model calculations predict an op timum frequency for measuring thermal transport within the film. Measu rements on films with various thicknesses reveal a thermal conductivit y close to the bulk value for nickel while gold films exhibit a reduce d conductivity with decreasing film thickness. (C) 1997 American Insti tute of Physics.