CORRELATION BETWEEN INTERFACIAL CHEMISTRY AND ELECTROSTATICS AT AN IRRADIATED N-CDTE AQUEOUS FLUORIDE JUNCTION

Citation
Nr. Detacconi et al., CORRELATION BETWEEN INTERFACIAL CHEMISTRY AND ELECTROSTATICS AT AN IRRADIATED N-CDTE AQUEOUS FLUORIDE JUNCTION, Journal of physical chemistry, 98(15), 1994, pp. 4104-4108
Citations number
46
Categorie Soggetti
Chemistry Physical
ISSN journal
00223654
Volume
98
Issue
15
Year of publication
1994
Pages
4104 - 4108
Database
ISI
SICI code
0022-3654(1994)98:15<4104:CBICAE>2.0.ZU;2-C
Abstract
Three complementary techniques, namely laser Raman spectroscopy, elect rolyte electroreflectance (EER), and capacitance-voltage measurements, were combined to establish a correlation between the interfacial chem istry and electrostatics at an irradiated n-CdTe/aqueous fluoride elec trolyte interface. Thus, supra-bandgap irradiation of the latter was s hown by laser Raman spectroscopy to produce a Te corrosion layer at th e n-CdTe surface. This resulted in an additional voltage drop across t his layer as indicated both by a modification of the EER profile and b y the positive shift in the flatband potential, These new data provide chemical support for an (electrostatic) model proposed by earlier wor kers.