MULTIPLE-BEAM X-RAY-DIFFRACTION FOR PHYSICAL DETERMINATION OF REFLECTION PHASES AND ITS APPLICATIONS

Citation
E. Weckert et K. Hummer, MULTIPLE-BEAM X-RAY-DIFFRACTION FOR PHYSICAL DETERMINATION OF REFLECTION PHASES AND ITS APPLICATIONS, Acta crystallographica. Section A, Foundations of crystallography, 53, 1997, pp. 108-143
Citations number
73
Categorie Soggetti
Crystallography
ISSN journal
01087673
Volume
53
Year of publication
1997
Part
2
Pages
108 - 143
Database
ISI
SICI code
0108-7673(1997)53:<108:MXFPDO>2.0.ZU;2-K
Abstract
Theoretical and experimental advances in determination of three-phase invariants by multiple-beam X-ray diffraction are reviewed. The fundam ental physics and mathematical analyses are explained. Plane-wave dyna mical theory for the interpretation of multiple-beam interference is s ummarized. New results of its applications to the solution of the enan tiomorphism problem of light-atom structures and to the solution of th e structure of macromolecules by means of measured phases in conjuncti on with statistical methods are reported. Practical aspects of applyin g the three-beam diffraction technique to proteins are emphasized.