INTERVALLEY SCATTERING POTENTIALS OF GE FROM DIRECT EXCITON ABSORPTION UNDER PRESSURE

Citation
Gh. Li et al., INTERVALLEY SCATTERING POTENTIALS OF GE FROM DIRECT EXCITON ABSORPTION UNDER PRESSURE, Physical review. B, Condensed matter, 49(12), 1994, pp. 8017-8023
Citations number
43
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
49
Issue
12
Year of publication
1994
Pages
8017 - 8023
Database
ISI
SICI code
0163-1829(1994)49:12<8017:ISPOGF>2.0.ZU;2-I
Abstract
We have measured the dependence on pressure of the low-temperature (10 K) direct exciton optical absorption of Ge up to 12.3 GPa. rhe sharp exciton peak at the direct energy gap (E0) of Ge is found to broaden s ignificantly with increasing pressure. This effect, which is attribute d to intervalley scattering via electron-phonon interaction, is most p ronounced for pressures above approximately 0.6 GPa, where the X valle y becomes the lowest conduction-band minimum. From the pressure-induce d exciton broadening we determine the GAMMA to X point intervalley def ormation-potential constant D(GAMMAX)=2.2(3) eV/angstrom and an upper bound of D(GAMMAL) = 4.5 eV/A for scattering from GAMMA to the L valle ys. The deformation potential D(GAMMAX) of Ge is about 50% smaller com pared to isoelectronic GaAs. This difference is attributed to the fact that interatomic matrix elements between s and d states of the GAMMA and X conduction-band minima as well as the d character of the X minim um are larger in GaAs.