K. Fang et al., ROUGHENING AND FACETING IN A PB THIN-FILM GROWING ON THE PB(110) SURFACE, Physical review. B, Condensed matter, 49(12), 1994, pp. 8331-8339
Using high-resolution low-energy electron diffraction, we have observe
d nonconventional dynamic scaling during the molecular-beam-epitaxy gr
owth of Pb/Pb(110). The growth front becomes increasingly rough as mor
e Pb atoms are deposited. At a low growth rate, the interface width w
changes with deposition time t in a scaling form w approximately t(bet
a) with beta = 0.77 +/- 0.05. The other scaling hypothesis involving t
he lateral correlation length xi approximately t(beta/alpha) is no lon
ger valid and the local roughness increases dramatically. However, the
short-range height-height correlation function H(r) still scales with
r, the horizontal distance between two points in the surface, in the
form of H(r,t) approximately f(t)r2alpha with alpha = 1.33 +/- 0.05. A
t the later stage of growth, the rough surface eventually induces an a
nistropic {111} faceting. Faceting is found to occur earlier when the
deposition rate is high.