ATOMIC LAYER-BY-LAYER EPITAXY OF OXIDE SUPERCONDUCTORS BY MOCVD

Citation
S. Yamamoto et al., ATOMIC LAYER-BY-LAYER EPITAXY OF OXIDE SUPERCONDUCTORS BY MOCVD, Applied surface science, 112, 1997, pp. 30-37
Citations number
16
Categorie Soggetti
Physics, Condensed Matter","Chemistry Physical","Materials Science, Coatings & Films
Journal title
ISSN journal
01694332
Volume
112
Year of publication
1997
Pages
30 - 37
Database
ISI
SICI code
0169-4332(1997)112:<30:ALEOOS>2.0.ZU;2-K
Abstract
We have prepared thin films of c-axis oriented YBa2Cu3Ox (YBCO) with a very smooth surface and roughness of less than a monomolecular layer of YBCO by atomic layer-by-layer metalorganic chemical vapor depositio n on SrTiO3(100) and NdGaO3(110) substrates. A YBCO film with a large terrace width of 660 nm has been obtained on a NdGaO3(110) substrate. We have clarified the correlation between boulder formation and disloc ations in the substrates by atomic force microscope observation. We ha ve attempted to avoid producing boulder nuclei on dislocations exposed on the substrate surface by changing the usual sequence of source sup ply, Ba/Cu/Ba/Cu/Y/Cu, for 1 cycle into a new sequence, Ba/Ba/Y/Cu/Cu/ Cu, and have successfully prevented the boulders. We also discuss issu es of third generation precursors which are used in the liquid phase. We have also investigated hetero epitaxy of Sm2O3 ultrathin insulating films on YBCO thin films.