COMPARISON OF LATTICE-PARAMETERS OBTAINED FROM AN INTERNAL SILICON MONOCRYSTAL STANDARD

Authors
HARTWIG J BAKMISIUK J BERGER H BRUHL HG OKADA Y GROSSWIG S WOKULSKA K WOLF J
Citation
J. Hartwig et al., COMPARISON OF LATTICE-PARAMETERS OBTAINED FROM AN INTERNAL SILICON MONOCRYSTAL STANDARD, Physica status solidi. a, Applied research, 142(1), 1994, pp. 19-26
Citations number
27
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physica status solidi. a, Applied research → ACNP
ISSN journal
00318965
Volume
142
Issue
1
Year of publication
1994
Pages
19 - 26
Database
ISI
SICI code
0031-8965(1994)142:1<19:COLOFA>2.0.ZU;2-X
Abstract
The lattice parameter of a highly perfect monocrystalline silicon samp le is measured in six laboratories using three different diffraction m ethods. The quality of the measurements and of the applied corrections is already sufficiently high to compare lattice parameters measured b y means of the used methods and CuKalpha radiation on an absolute scal e with an accuracy of about DELTAa/a = 3 x 10(-6).