THE DIFFRACTION PATTERNS OF CRYSTALS WITH LAYER DEFECTS

Authors
BERLINER R GOODING RJ
Citation
R. Berliner et Rj. Gooding, THE DIFFRACTION PATTERNS OF CRYSTALS WITH LAYER DEFECTS, Acta crystallographica. Section A, Foundations of crystallography, 50, 1994, pp. 98-106
Citations number
31
Categorie Soggetti
Crystallography
Journal title
Acta crystallographica. Section A, Foundations of crystallography → ACNP
ISSN journal
01087673
Volume
50
Year of publication
1994
Part
1
Pages
98 - 106
Database
ISI
SICI code
0108-7673(1994)50:<98:TDPOCW>2.0.ZU;2-K
Abstract
A method for the calculation of X-ray and neutron diffraction profiles of crystals with layer defects is described. Averages over a computer model of a configurational ensemble of crystallites with defects are used to define the scattering cross section. The method easily accommo dates the modeling of complex defect geometries or correlations. Diffr acted intensity profiles for the NixAl1-x(5, 2BAR) monoclinic martensi te, trigonal polytypes and body-centered-cubic crystals are presented as examples.