EXAFS AND XANES STUDIES OF SILICA-TITANIA SOL-GEL FILMS

Authors
ALMEIDA RM MARQUES MID ORIGNAC X
Citation
Rm. Almeida et al., EXAFS AND XANES STUDIES OF SILICA-TITANIA SOL-GEL FILMS, JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 8(1-3), 1997, pp. 293-297
Citations number
10
Categorie Soggetti
Material Science
Journal title
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY → ACNP
ISSN journal
09280707
Volume
8
Issue
1-3
Year of publication
1997
Pages
293 - 297
Database
ISI
SICI code
0928-0707(1997)8:1-3<293:EAXSOS>2.0.ZU;2-G
Abstract
A series of SiO2-TiO2 sol-gel films with and without heat treatment we re analyzed by EXAFS and XANES spectroscopies. Both techniques indicat e that essentially all Ti4+ ions remain four-fold coordinated, with a Ti-O bond distance between 1.82-1.85 Angstrom. In the glassy films pro duced by heat treatment at 900 degrees C, a gradual phase separation m ay occur at the nanoscale, as the TiO2 concentration of the films incr eases.