N. Ozer et Cm. Lampert, STRUCTURAL AND OPTICAL-PROPERTIES OF SOL-GEL DEPOSITED PROTON CONDUCTING TA2O5 FILMS, JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 8(1-3), 1997, pp. 703-709
Proton conducting tantalum oxide films were deposited on ITO (Indium T
in Oxide) coated glass, fused silica and soda-lime glass substrates by
spin coating using a sol-gel process. The coating solutions were prep
ared using Ta(OC2H5)(5) as a precursor. X-ray diffraction studies dete
rmined that the sol-gel films, heat treated at temperatures below 400
degrees C, were amorphous. Films heat treated at higher temperatures w
ere crystalline with the hexagonal delta-Ta2O5 structure. The solar tr
ansmission values (T-s) of tantala films on glass generally range from
0.8-0.9, depending on thickness. The refractive index and the extinct
ion coefficient were evaluated from transmittance characteristics in t
he UV-VIS-NIR regions. The refractive index values calculated at lambd
a = 550 nm increased from n = 1.78 to 1.97 with increasing heat treatm
ent from 150 to 450 degrees C. The films heat treated at different tem
peratures showed low absorption, with extinction coefficients of small
er than k = 1 x 10(-3) in the visible range. Impedance spectroscopic i
nvestigations performed on Ta2O5 films revealed that these films have
a protonic conductivity of 3.2 x 10(-4) S/m. The films are suitable fo
r proton conducting layers in electrochromic (EC) devices.