SCANNING TUNNEL MICROSCOPY SURFACE-STATE ELECTRON-SCATTERING - 2-TIP RESULTS FROM ONE-TIP DATA

The scanning tunneling microscopy experiments have opened up a new cla ss of scattering inversion problems, where the scatterers are fixed an d the boundary condition corresponds to a movable point source. Using a least square method. we can obtain the scattering T-matrix for an as sembly of atoms (s-wave point scatterers) on a surface; and thus the o ff-diagonal elements of the Green function just from the knowledge of the one-tip data. Therefore, transport property measurements such as t hat suggested by Niu et al., which are needed when other kind of defec ts an present, can be predicted solely from the one-tip data.