X-RAY-PHOTOELECTRON AND X-RAY-PHOTOABSORPTION STUDY OF PRESSURE-AMORPHIZED T-NB2O5

Authors
Citation
Js. Tse et al., X-RAY-PHOTOELECTRON AND X-RAY-PHOTOABSORPTION STUDY OF PRESSURE-AMORPHIZED T-NB2O5, Physical review. B, Condensed matter, 49(13), 1994, pp. 9180-9181
Citations number
7
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
49
Issue
13
Year of publication
1994
Pages
9180 - 9181
Database
ISI
SICI code
0163-1829(1994)49:13<9180:XAXSOP>2.0.ZU;2-F
Abstract
A recent report suggested that pressure-induced amorphization of the T phase of Nb2O5 is accompanied by a reduction of Nb from the pentavale nt state with the simultaneous loss of oxygen atoms. This conjecture i s examined in detail by x-ray-photoelectron and x-ray-absorption spect roscopy. No reduction was detected within the sensitivity of the measu rements, which impose an upper limit for the concentration of reduced Nb, if any, to be less than 3%. The L(II,III)-edge photoabsorption spe ctra suggest that the recovered high-pressure phase has a more compact ed oxygen environment, which is often found in densified materials.