LOAD-DEPENDENT TOPOGRAPHIC AND FRICTION STUDIES OF INDIVIDUAL ION TRACKS IN LAYERED MATERIALS BY SCANNING FORCE MICROSCOPY AND LATERAL FORCE MICROSCOPY

Authors
SEIDER M SCHWARZ UD WIESENDANGER R
Citation
M. Seider et al., LOAD-DEPENDENT TOPOGRAPHIC AND FRICTION STUDIES OF INDIVIDUAL ION TRACKS IN LAYERED MATERIALS BY SCANNING FORCE MICROSCOPY AND LATERAL FORCE MICROSCOPY, Physical review. B, Condensed matter, 53(24), 1996, pp. 16180-16183
Citations number
12
Categorie Soggetti
Physics, Condensed Matter
Journal title
Physical review. B, Condensed matter → ACNP
ISSN journal
01631829
Volume
53
Issue
24
Year of publication
1996
Pages
16180 - 16183
Database
ISI
SICI code
0163-1829(1996)53:24<16180:LTAFSO>2.0.ZU;2-K
Abstract
We have studied individual latent tracks induced by 500-MeV Xe ions in muscovite mica by scanning force microscopy (SFM) and lateral force m icroscopy (LFM) as a function of the applied loading force F-n. It was found that the observed contrast as well as the apparent diameter of the latent ion tracks as imaged by SFM and LFM depends critically on F -n. Good agreement with small-angle x-ray-diffraction data is obtained only in the limit of zero applied load.