ELECTRICAL-CONDUCTIVITY SFM STUDY OF AN ULTRAFILTRATION MEMBRANE

Citation
Pj. Gallo et al., ELECTRICAL-CONDUCTIVITY SFM STUDY OF AN ULTRAFILTRATION MEMBRANE, Nanotechnology, 8(1), 1997, pp. 10-13
Citations number
9
Categorie Soggetti
Engineering,"Physics, Applied
Journal title
ISSN journal
09574484
Volume
8
Issue
1
Year of publication
1997
Pages
10 - 13
Database
ISI
SICI code
0957-4484(1997)8:1<10:ESSOAU>2.0.ZU;2-M
Abstract
A method for local investigation of ultrafiltration membrane pore netw orks has been developed in order to complement bulk measurements and c alculations. An Anopore(TM) membrane (200 nm) pore network was filled with electrodeposited nickel. Membranes were analysed simultaneously w ith normal scanning force microscopy (SFM) and electrical-conductivity SFM. Cantilevers coated with 10 Omega cm diamond were used to map bot h normal force and conductivity. Conductivity images show two kinds of pores: bright pores with diameters of 192 +/- 2 nm and grey pores wit h diameters of 172 +/- 5 nm, depending on the depth of the nickel tube s. The average pore diameter measured from the normal SFM images is 21 7 +/- 3 nm, and the ratio of the conductive pores to total number of p ores is 49.8%. Preferential flow paths can be established from this te chnique.