NEUTRON AND X-RAY REFLECTOMETRY - SOLID MULTILAYERS AND CRUMPLING FILMS

Authors
BROWN AS HOLT SA SAVILLE PM WHITE JW
Citation
As. Brown et al., NEUTRON AND X-RAY REFLECTOMETRY - SOLID MULTILAYERS AND CRUMPLING FILMS, Australian journal of physics, 50(2), 1997, pp. 391-405
Citations number
26
Categorie Soggetti
Physics
Journal title
Australian journal of physics → ACNP
ISSN journal
00049506
Volume
50
Issue
2
Year of publication
1997
Pages
391 - 405
Database
ISI
SICI code
0004-9506(1997)50:2<391:NAXR-S>2.0.ZU;2-T
Abstract
The structures of films and interfaces at the molecular level can be d etermined from specular reflectivity measurements using neutrons and X -rays. A general introduction to the principles of neutron and X-ray r eflectometry is given. Illustrative examples of the application of neu tron and X-ray reflectometry to problems of chemical and physical inte rest are presented.