LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY

Citation
B. Reihl et al., LOW-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY, Physica. B, Condensed matter, 197(1-4), 1994, pp. 64-71
Citations number
40
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
09214526
Volume
197
Issue
1-4
Year of publication
1994
Pages
64 - 71
Database
ISI
SICI code
0921-4526(1994)197:1-4<64:LS>2.0.ZU;2-#
Abstract
The novel technique of low-temperature scanning tunneling microscopy i s used to study conventional and high-T(c) superconductors (spatial id entification and distribution of the superconducting gap, vortex movem ent, etc.), but also custom-designed materials which are unstable at r oom temperature, e.g. xenon layers and size-selected clusters, or spec ies whose rotational or vibrational movements have to be frozen in to achieve atomic resolution. We present the specific design and advantag es of our low-temperature ultra-high vacuum scanning tunneling microsc ope along with recent results on the internal structure of C60 fullere ne molecules and their photon emitting properties.