K. Franke et M. Weihnacht, EVALUATION OF ELECTRICALLY POLAR SUBSTANCES BY ELECTRIC SCANNING FORCE MICROSCOPY .1. MEASUREMENT SIGNALS DUE TO MAXWELL STRESS, Ferroelectrics. Letters section, 19(1-2), 1995, pp. 25-33
The electric scanning force microscope (EFM) is used for the high-reso
lution characterization of electrically polar substances. An EFM is co
nsidered, the tip of which is electrically conductive and has a given
potential. The tip of the EFM is exposed to Maxwell stress caused by f
erroelectric domains and sample permittivity. This Maxwell stress is a
nalytically calculated in a one-dimensional model. The results of calc
ulation are compared with the results of EFM measurements. The method
for measuring ferroelectric domains is in particular discussed.