EVALUATION OF ELECTRICALLY POLAR SUBSTANCES BY ELECTRIC SCANNING FORCE MICROSCOPY .1. MEASUREMENT SIGNALS DUE TO MAXWELL STRESS

Citation
K. Franke et M. Weihnacht, EVALUATION OF ELECTRICALLY POLAR SUBSTANCES BY ELECTRIC SCANNING FORCE MICROSCOPY .1. MEASUREMENT SIGNALS DUE TO MAXWELL STRESS, Ferroelectrics. Letters section, 19(1-2), 1995, pp. 25-33
Citations number
11
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
07315171
Volume
19
Issue
1-2
Year of publication
1995
Pages
25 - 33
Database
ISI
SICI code
0731-5171(1995)19:1-2<25:EOEPSB>2.0.ZU;2-Y
Abstract
The electric scanning force microscope (EFM) is used for the high-reso lution characterization of electrically polar substances. An EFM is co nsidered, the tip of which is electrically conductive and has a given potential. The tip of the EFM is exposed to Maxwell stress caused by f erroelectric domains and sample permittivity. This Maxwell stress is a nalytically calculated in a one-dimensional model. The results of calc ulation are compared with the results of EFM measurements. The method for measuring ferroelectric domains is in particular discussed.