FORMATION OF BR-TERMINATED SI-6 RINGS DURING ETCHING OF SI(111)-7X7

Citation
Rj. Pechman et al., FORMATION OF BR-TERMINATED SI-6 RINGS DURING ETCHING OF SI(111)-7X7, Surface science, 341(3), 1995, pp. 1085-1090
Citations number
28
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
341
Issue
3
Year of publication
1995
Pages
1085 - 1090
Database
ISI
SICI code
0039-6028(1995)341:3<1085:FOBSRD>2.0.ZU;2-C
Abstract
Scanning tunneling microscopy was used to study the morphological evol ution of Si(111)-7 x 7 exposed to molecular bromine. Etching at 900 K results in the removal of adatoms and conversion from the 7 x 7 surfac e to a 1 x 1 Br-terminated structure. Removal is dominated by bilayer step retreat with edge profiles that reflect etching anisotropies. Uni que structures attributed to regrowth of Si released during step etchi ng were consistent with six-membered Si rings terminated with Br. The distribution of such rings near the steps reflects the local bonding a nd etching anisotropies for the steps. Theoretical analyses of these r ings terminated with Cl determine bond lengths, bond angles, and charg e transfer within the ring.