S. Sridhar et Bj. Baliga, THE SIMEST - AN EST STRUCTURE WITHOUT PARASITIC THYRISTOR ACHIEVED USING SIMOX TECHNOLOGY, Electronics Letters, 31(23), 1995, pp. 2048-2050
A new EST structure, in which the lateral N-channel MOSFET is isolated
from the thyristor bq using SIMOX technology to eliminate the parasit
ic thyristor, is presented. This structure is experimentally demonstra
ted to exhibit high voltage current saturation at large gate biases be
yond the breakdown voltage of the lateral N-channel MOSFET and a lower
on-state voltage drop than the dual channel EST.