Pv. Zukovski et al., THE INFLUENCE OF ION-IMPLANTATION CONDITIONS ON DEFECT FORMATION AND AMORPHIZATION IN SILICON, Radiation effects and defects in solids, 132(1), 1994, pp. 11-18
A phenomenological model describing the dependence of deformation proc
esses on ion implantation conditions is preposed. Experimental results
of defect formation as well as amorphisation in silicone for the impl
antation with Ne+, ArC and Kr+ ions in the temperature interval of 150
-500 K and for ion current densities of 0.5 to 4.0 mu A/cm(2) are pres
ented. An analysis of the experimental data within the framework of th
e proposed model has been carried out. The basic characteristics of th
e defects appearing at silicon amorphisation also have been defined.