M. Nekab et al., COMPARATIVE METHODS FOR DETERMINATION OF RARE-EARTHS IN GEOLOGICAL AND MINERAL SAMPLES, Journal of radioanalytical and nuclear chemistry, 182(2), 1994, pp. 247-256
Particle induced X-ray emission (PIXE) has been used for the quantitat
ive analysis of rare earth elements (REE) in thick targets prepared fr
om geological and mineral samples. Measurements were made with 1 and 3
MeV proton beams. For comparison, determination of the same elements
was made by X-ray fluorescence (XRF) using a Am-241 annular source. Mi
nimal detectable limits (MDL) have been estimated for the two situatio
ns. Neutron activation analysis (NAA) has also been used for the deter
mination of REE at the ppm level.