Compression tests at constant strain rate were performed on [ 001 ] or
iented single crystals of undoped indium phosphide, in the temperature
range 300 degrees C (0.43 Tm) to 700 degrees C (0.72 Tm). Critical re
solved shear stresses are compared with those reported in the literatu
re. Scanning electron microscopy in the cathodoluminescence mode and t
ransmission electron microscopy were used to investigate the deformed
sample microstructure. No microtwinning was observed.