SIMPLE COMPUTER-AIDED-DESIGN FORMULA AND NETWORK INTERPRETATION FOR LOSS EVALUATION IN MICROSTRIP SUPERCONDUCTOR CONDUCTOR BILAYER STRUCTURE

Citation
D. Ladret et al., SIMPLE COMPUTER-AIDED-DESIGN FORMULA AND NETWORK INTERPRETATION FOR LOSS EVALUATION IN MICROSTRIP SUPERCONDUCTOR CONDUCTOR BILAYER STRUCTURE, Applied physics letters, 67(21), 1995, pp. 3192-3193
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
67
Issue
21
Year of publication
1995
Pages
3192 - 3193
Database
ISI
SICI code
0003-6951(1995)67:21<3192:SCFANI>2.0.ZU;2-0
Abstract
Line resistance analytical results obtained from the proposed simple s urface impedance formula describing a superconductor-conductor bilayer structure were found in good agreement with numerical results. Networ k interpretation of this structure is performed. Important information about the loss frequency behavior (frequency cutoff, asymptotic varia tion) and influence of the thickness ratio of the two layers on bilaye r losses, are commented on. (C) 1995 American Institute of Physics.