D. Ladret et al., SIMPLE COMPUTER-AIDED-DESIGN FORMULA AND NETWORK INTERPRETATION FOR LOSS EVALUATION IN MICROSTRIP SUPERCONDUCTOR CONDUCTOR BILAYER STRUCTURE, Applied physics letters, 67(21), 1995, pp. 3192-3193
Line resistance analytical results obtained from the proposed simple s
urface impedance formula describing a superconductor-conductor bilayer
structure were found in good agreement with numerical results. Networ
k interpretation of this structure is performed. Important information
about the loss frequency behavior (frequency cutoff, asymptotic varia
tion) and influence of the thickness ratio of the two layers on bilaye
r losses, are commented on. (C) 1995 American Institute of Physics.