SURFACE CHEMICAL CHARACTERIZATION USING XPS AND TOF-SIMS OF LATEX-PARTICLES PREPARED BY THE EMULSION COPOLYMERIZATION OF FUNCTIONAL MONOMERS WITH METHYL-METHACRYLATE AND 4-VINYLPYRIDINE

The surface chemical analyses of a series of colloids based on poly(me thyl methacrylate) and poly(4-vinylpyridine) have been carried out usi ng X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOF-SIMS). The colloids were prepared by the v inyl polymerization of monomers bearing the reactive functional groups hydroxyl, amide, and epoxide. XPS and TOF-SIMS provided complementary information on the functional groups at the colloid particle surfaces and gave good correlation with electrophoretic mobility and particle size data. This paper demonstrates the capability of these surface ana lysis techniques for studying the complex surface chemistries of copol ymer colloid systems.