PHOTOLUMINESCENCE OF EXCITONS BOUND TO THE RADIATION-DAMAGE DEFECTS B-41 (1.1509 EV) IN SILICON

Citation
As. Kaminskii et al., PHOTOLUMINESCENCE OF EXCITONS BOUND TO THE RADIATION-DAMAGE DEFECTS B-41 (1.1509 EV) IN SILICON, Solid state communications, 97(2), 1996, pp. 137-142
Citations number
11
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
97
Issue
2
Year of publication
1996
Pages
137 - 142
Database
ISI
SICI code
0038-1098(1996)97:2<137:POEBTT>2.0.ZU;2-2
Abstract
Using photoluminescence spectroscopy in magnetic fields up to 12 T, we show that the very shallow isoelectronic centers B-41 (1.15090 eV pri ncipal no phonon line) created by a neutron irradiation in a phosphoru s-doped silicon grown in a hydrogen atmosphere have the C-3v symmetry. We explain the structure of the energy levels of the excitons bound t o these centers and determine their lifetime and g-factors of the boun d particles.