HISTORICAL COHORT INVESTIGATION OF SPONTANEOUS-ABORTION IN THE SEMICONDUCTOR HEALTH STUDY - EPIDEMIOLOGIC METHODS AND ANALYSES OF RISK IN FABRICATION OVERALL AND IN FABRICATION WORK GROUPS
Jj. Beaumont et al., HISTORICAL COHORT INVESTIGATION OF SPONTANEOUS-ABORTION IN THE SEMICONDUCTOR HEALTH STUDY - EPIDEMIOLOGIC METHODS AND ANALYSES OF RISK IN FABRICATION OVERALL AND IN FABRICATION WORK GROUPS, American journal of industrial medicine, 28(6), 1995, pp. 735-750
The risk of spontaneous abortion (SAB) in the semiconductor industry w
as examined in a historical cohort study of pregnancies at 14 companie
s. We identified female employees who had worked for at least 6 months
and whose ages ranged from 18 to 44 years during the 1986-1989 study
period. Using company records, we included all fabrication-room (fab)
employees and an approximately equal number of nonfabrication (nonfab)
employees, for a total sample of 7,269. Telephone interviews with 6,0
88 women (84%) identified 904 eligible pregnancies and 113 SABs. Expos
ure classification was based on questionnaire and industrial hygiene a
ssessments of tasks the women performed during the first trimester of
pregnancy. Using logistic regression to control for age, smoking, ethn
icity, education, income, year of pregnancy, and stress, we found a hi
gher risk of SAB in fab employees than in nonfab employees (15.0% of f
ab pregnancies ended in SAB vs. 10.4% of nonfab pregnancies, adjusted
relative risk [RR] = 1.43, 95% CI = 0.95-2.09). Analysis of fab work g
roups showed that the highest relative risk was in masking employees (
17.5% SAB rate, adjusted RR = 1.78, 95% CI = 1.17-2.62 in comparison w
ith nonfab employees). Within masking, the highest risk was found in e
tching-related process employees (22.2% SAB rate, adjusted RR = 2.08,
95% CI = 1.27-3.19 in comparison to nonfab employees). (C) 1995 Wiley-
Liss, Inc.