Eb. Gold et al., PROSPECTIVELY ASSESSED MENSTRUAL-CYCLE CHARACTERISTICS IN FEMALE WAFER-FABRICATION AND NONFABRICATION SEMICONDUCTOR EMPLOYEES, American journal of industrial medicine, 28(6), 1995, pp. 799-815
Women aged 18-44 years in silicon-wafer fabrication-room (fab) jobs an
d frequency-matched women in nonfab jobs were screened for a prospecti
ve study of reproductive health (n = 2,639). Among the 739 (28%) eligi
ble women, 481 (65%) completed a baseline interview; 402 completed at
least one menstrual cycle of follow-up with daily diaries and urinary
assays to exclude conceptive cycles. Adjusted mean cycle lengths (MCL)
did not differ between fab and nonfab women (p = 0.97). Women working
in thin film and ion implantation (TFII) had the highest adjusted MCL
(34.8 +/- 1.7 days) compared with nonfab workers (32.5 +/- 1.4 days,
p = 0.07). Among women working exclusively in one group, TFII women ha
d significantly higher MCL (36.1 +/- 2.04 days) than nonfab women (32.
0 +/- 1.38 days, p = 0.017). TFII women were also more likely to have
all cycles >35 days (adjusted relative risk [RR] = 2.45; 95% CI = 0.85
-6.06). Variability was assessed by logarithmic transformation of the
mean standard deviation (MLSD) in cycle length per woman and adjusted
for age and ethnicity (4.5 days for fab vs. 4.0 days for nonfab, p = 0
.16). Women working exclusively in TFII or photolithography (PHOTO) ha
d significantly higher adjusted MLSD in cycle length (6.68 +/- 1.28 an
d 5.72 +/- 1.24 days, respectively) than women in nonfab (4.1 +/- 1.16
days, p = 0.013 and 0.019, respectively). Fab and nonfab women did no
t differ significantly in mean days of bleeding or risk of having cycl
es >35 or <24 days. However, elevated risks of having cycles <24 days
were seen in supervisor engineers (adjusted RR = 2.46, 95% CI = 1.19-3
.63) and PHOTO women (adjusted RR = 1.83, 95% CI = 0.94-2.88). (C) 199
5 Wiley-Liss, Inc.