PROSPECTIVE ASSESSMENT OF FECUNDABILITY OF FEMALE SEMICONDUCTOR WORKERS

Citation
B. Eskenazi et al., PROSPECTIVE ASSESSMENT OF FECUNDABILITY OF FEMALE SEMICONDUCTOR WORKERS, American journal of industrial medicine, 28(6), 1995, pp. 817-831
Citations number
34
Categorie Soggetti
Public, Environmental & Occupation Heath
ISSN journal
02713586
Volume
28
Issue
6
Year of publication
1995
Pages
817 - 831
Database
ISI
SICI code
0271-3586(1995)28:6<817:PAOFOF>2.0.ZU;2-I
Abstract
To investigate a possible effect of reduced fecundability (probability of conception per menstrual cycle) among women who fabricate silicon wafers, 152 fabrication-room (fab) and 251 nonfab workers were followe d for an average of five menstrual cycles. Daily urine samples were an alyzed to confirm clinical spontaneous abortions (SABs) and early feta l losses (EFLs). Adjusted fecundability odds ratios (FRs) for fab work ers ranged from 0.59 to 0.72 (p = 0.09-0.28 vs. nonfab). For clinical pregnancies only, the adjusted FR ranged from 0.43-0.50 (p = 0.04-0.09 vs. nonfab). This lower fecundability was most pronounced among dopan ts and thin-film workers [adjusted FR = 0.61, 95% confidence interval (CI) = 0.27-1.40 for all pregnancies; adjusted FR = 0.22, 95% CI = 0.0 5-0.96 for clinical pregnancies] and in workers exposed to ethylene-ba sed glycol ethers (adjusted FR = 0.37, 95% CI = 0.11-1.19). (C) 1995 W iley-Liss, Inc.