AN ATOMIC-FORCE MICROSCOPY STUDY OF POLYESTER SURFACES

Citation
J. Jing et al., AN ATOMIC-FORCE MICROSCOPY STUDY OF POLYESTER SURFACES, Journal of Materials Science, 30(22), 1995, pp. 5700-5704
Citations number
10
Categorie Soggetti
Material Science
ISSN journal
00222461
Volume
30
Issue
22
Year of publication
1995
Pages
5700 - 5704
Database
ISI
SICI code
0022-2461(1995)30:22<5700:AAMSOP>2.0.ZU;2-N
Abstract
The surface properties of amorphous and crystalline polyester films, w ell below their glass transition temperature, have been studied with a n atomic force microscope. For amorphous films a corrugated pattern de velops on the surface as a result of scanning and the corrugations are always perpendicular to the scan direction. When scanning is stopped the pattern shows a slight relaxation; however, the surface is plastic ally deformed. When crystalline films are scanned, similar patterns ar e seen which are less pronounced and require a much longer scan time. These results suggest that the physical properties of a glassy polyest er surface may be different from the bulk, and the freedom of macromol ecules is reduced upon crystallization, thus suppressing molecular mot ion at the surface.