Lead magnesium niobate titanate (PMN-PT) thin films were prepared on P
t-coated magnesium oxide single-crystal substrate (Pt(100)/MgO(100)) a
nd Pt- and Ti-coated oxidized Si wafer (Pt(111)/Ti/SiO2/Si(100)) at 68
0-780 degrees C by metalorganic chemical vapor deposition (MOCVD). The
PMN-PT thin films comprising perovskite structure as a main phase wer
e obtained in the composition of Ti/(Mg+Nb+Ti)greater than or equal to
25 mol%. Their room-temperature dielectric constant was 1000-1500 mea
sured at 100 mV and 1 kHz.