APPARENT LOW SURFACE-AREAS IN MICROPOROUS SIO2-XEROGELS

Citation
Y. Polevaya et al., APPARENT LOW SURFACE-AREAS IN MICROPOROUS SIO2-XEROGELS, JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY, 5(1), 1995, pp. 65-70
Citations number
15
Categorie Soggetti
Material Science
ISSN journal
09280707
Volume
5
Issue
1
Year of publication
1995
Pages
65 - 70
Database
ISI
SICI code
0928-0707(1995)5:1<65:ALSIMS>2.0.ZU;2-A
Abstract
Nitrogen adsorption at -195 degrees C serves as routine method for the measurement of surface area of porous materials derived by sol-gel pr ocedures. In a systematic study of the simultaneous effect of the pH a nd water-silane ratio of the starting solutions of preparation of SiO2 xerogels on their surface areas, it was found that conditions of high acidity and low water/silane ratio result in microporous materials, t he surface of which cannot be accessed by N-2 at -195 degrees C, withi n a realistic time scale, but only by CO2 at 0 degrees C. In a typical result for TMOS/water/methanol = 1/2/3 at pH = 1.0, the apparent N-2- area was zero, while the CO2-area was 414 m(2)/gr. It is recommended t o recheck apparent N-2-low surface areas of sol-gel materials by CO2 a dsorption. The behavior of pyrene-doped xerogels of this type is in ag reement with the structural characterization by adsorption.