SHORT TEST PROCEDURES FOR R-2R D A CONVERTERS BY ELECTRICAL MODELING AND APPLICATION OF THE AMBIGUITY ALGORITHM/

A reduced physical model of the integral non-linearity error in high r esolution R-2R D/A converters is obtained by circuit analysis and appl ication of the ambiguity algorithm. Its relationships with the well es tablished a priori model based on Rademacher functions is discussed. E xperiments, carried out on a sample of commercial 12 bit converters, d emonstrate that functional test programs based on this model achieve s horter test times and lower prediction errors than those based on larg er models obtained by straight QR factorization.