High electrical conductive BaRuO3 thin films with (110) perovskite ori
entation have been successfully fabricated on Si(100) substrates by pu
lsed ArF excimer laser deposition and post-annealing. The resistivity
of the films at room temperature is in the range of 10(-2)-10(-3) Ohm
cm. Auger electron spectroscopy (AES) measurement shows that the compo
sitions uniformly distributed throughout the film. Rutherford backscat
tering spectroscopy (RES) analysis indicates that the chemical stoichi
ometric ratio is well consistent with the ideal one as in BaRuO3.