We present a detailed model describing the effects of surface stress o
n the equilibrium spacing and biaxial modulus of thin metal films. The
model predicts that very thin films will equilibrate to a spacing in
the plane substantially smaller than the bulk spacing for the material
, and that this biaxial strain will vanish as the reciprocal of the fi
lm thickness. The model predicts enhancements in the biaxial modulus o
f thin metal films which also scale with the reciprocal of the film th
ickness. The magnitude of both the strain and the resulting change in
biaxial modulus are proportional to the magnitude of the surface stres
s. We verified the predictions of the surface-stress model by performi
ng molecular-dynamics computer simulations of thin metal films using a
n analytic form of the embedded-atom-method potential. The model was f
ound to predict accurately the equilibrium properties of thin metal fi
lms.