ATOMIC-LEVEL WIDTHS FOR X-RAY SPECTROMETRY

Citation
Jl. Campbell et T. Papp, ATOMIC-LEVEL WIDTHS FOR X-RAY SPECTROMETRY, X-ray spectrometry, 24(6), 1995, pp. 307-319
Citations number
78
Categorie Soggetti
Spectroscopy
Journal title
ISSN journal
00498246
Volume
24
Issue
6
Year of publication
1995
Pages
307 - 319
Database
ISI
SICI code
0049-8246(1995)24:6<307:AWFXS>2.0.ZU;2-7
Abstract
A self-consistent set of level widths for the K-N7 subshells is assemb led using literature experimental data from a variety of spectroscopic methods, In cases where Coster-Kronig processes contribute significan tly, the widths differ from the predictions of the atomic single-parti cle model; in the restricted regions where atomic many-body prediction s are available, the agreement is much better, The assembled widths wi ll be useful to Si(Li) spectroscopists who wish to include natural wid th in the description of spectrometer lineshape; such inclusion will i mprove accuracy in both fundamental and analytical work. The present d atabase is also of value in identifying where improvements to the curr ently incomplete knowledge of natural widths are most critical.