M. Lankosz et Pa. Pella, QUANTITATIVE-ANALYSIS OF INDIVIDUAL PARTICLES BY X-RAY MICROFLUORESCENCE SPECTROMETRY, X-ray spectrometry, 24(6), 1995, pp. 327-332
A fundamental parameters method using polychromatic x-ray microbeam ex
citation was developed and applied to the quantitative analysis of ind
ividual particles from 50-160 mu m, From the ratio of the projected ar
ea of a particle to the cross-sectional area of the microbeam, an effe
ctive portion of the microbeam irradiating the particle can be determi
ned and used to correct the measured x-ray intensities, Because partic
les in this size range may not be infinitely thick and may contain unm
easurable elements such as C and O, calculation of the average mass th
ickness of the particle allows complete matrix absorption corrections
to be made, For this purpose, the ratio of coherent to incoherent x-ra
y tube target lines scattered from the particle was used to calculate
the average atomic number of the particle, and its mass thickness was
determined from incoherent scatter, A parametric equation was derived
and tested. In addition, irregularly shaped particles were analyzed us
ing a well known equation usually applied to flat samples having inter
mediate thickness, Both models were tested with homogeneous glass part
icles of known composition and size.