SPECIFIC FEATURES OF THE PROCEDURE OF X-RAY DETERMINATION OF THE DISLOCATION-STRUCTURE PARAMETERS OF SINGLE-CRYSTALS

A method and equipment for obtaining the complete distribution of norm als over the whole sphere of projections as opposed to other x-ray met hods of structure investigation that study projections or cross sectio ns of regions of increased intensity in the vicinity of nodes of the r eciprocal lattice are described. The possibility of studying the refle ctions necessary for single crystals with a scan step less than 1 degr ees in a specified angular range is ensured by the construction. The p ossibility of studying local specimen areas and averaging the results over a specified surface is feasible. A personal computer incorporated in the x-ray set-up maintains the control of thr diffractometer and d ata acquisition and processing.