In this paper, a zero-mean and band-limited fractal function is introd
uced to simulate a rough surface profile. According to the Kirchhoff T
heory, surface roughness measurement is simulated with the help of fas
t Fourier transformation (FFT) technology. A relationship between the
surface parameters and the reflected light intensity distribution is o
btained. In order to quantify rough surfaces, some criteria are propos
ed. Numerical results show that these criteria have a strong correlati
on with the RMS of surface height and they can be used for surface rou
ghness measurement and classification.