D. Hoffmann et al., THERMOVOLTAGE ACROSS A VACUUM BARRIER INVESTIGATED BY SCANNING-TUNNELING-MICROSCOPY - IMAGING OF STANDING ELECTRON WAVES, Physical review. B, Condensed matter, 52(19), 1995, pp. 13796-13798
The thermovoltage of a vacuum barrier has been studied by heating the
tip of a scanning tunneling microscope. It is extremely sensitive to m
inor variations of the electronic structure of the sample. As an examp
le an electronic surface state on Cu(lll) has been investigated. The r
eflection at step edges and other defects leads to an interference pat
tern modulating the thermovoltage by up to 2 mu V/K. The findings are
well described by a numerical calculation which confirms that the latt
er differs from a map of the electronic density of states.