THERMOVOLTAGE ACROSS A VACUUM BARRIER INVESTIGATED BY SCANNING-TUNNELING-MICROSCOPY - IMAGING OF STANDING ELECTRON WAVES

Citation
D. Hoffmann et al., THERMOVOLTAGE ACROSS A VACUUM BARRIER INVESTIGATED BY SCANNING-TUNNELING-MICROSCOPY - IMAGING OF STANDING ELECTRON WAVES, Physical review. B, Condensed matter, 52(19), 1995, pp. 13796-13798
Citations number
11
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
52
Issue
19
Year of publication
1995
Pages
13796 - 13798
Database
ISI
SICI code
0163-1829(1995)52:19<13796:TAAVBI>2.0.ZU;2-F
Abstract
The thermovoltage of a vacuum barrier has been studied by heating the tip of a scanning tunneling microscope. It is extremely sensitive to m inor variations of the electronic structure of the sample. As an examp le an electronic surface state on Cu(lll) has been investigated. The r eflection at step edges and other defects leads to an interference pat tern modulating the thermovoltage by up to 2 mu V/K. The findings are well described by a numerical calculation which confirms that the latt er differs from a map of the electronic density of states.