We describe a detailed experimental study of phase slip in the charge-
density-wave (CDW) conductor NbSe3. Phase slip is required for convers
ion between CDW current and single-particle current near current conta
cts. For both CDW's in NbSe3, the CDW current I-c, proportional to the
phase-slip rate, exhibits a diodelike dependence upon an excess volta
ge V-ps, the phase-slip voltage. For a given I-c (slip rate), V-ps inc
reases strongly with decreasing temperature, and at corresponding temp
eratures is roughly an order of magnitude larger for the T-p1 CDW than
for the T-p2 CDW. Current contacts applied to the side of the crystal
may lead to inhomogeneous current injection and allow CDW deformation
s and slip to extend beyond the contacts. Voltage contacts shunt curre
nt out of the crystal, and may cause CDW deformations and slip in thei
r vicinity. We describe improved measurements of phase slip using nonp
erturbing voltage contacts and end current contacts formed by selected
-area ion implantation. The results are consistent with those obtained
using side contacts, confirm the interpretation of V-ps as the drivin
g force behind phase slip, and provide information about the distribut
ion of slip near the current contacts. The predictions of Ramakrishna
et al. for phase slip by thermally activated of edge dislocation loops
nucleation account for some qualitative features of our experiments b
ut are in serious quantitative disagreement, suggesting that other sli
p mechanisms may be important.